4 results
Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1750-1751
- Print publication:
- July 2010
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Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1462-1463
- Print publication:
- July 2010
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In Situ Investigation of Dielectric Breakdown in Field Effect Transistors
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1298-1299
- Print publication:
- July 2010
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Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1426-1427
- Print publication:
- July 2009
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